Electrical Engineering Asked by Donald Krambeck on January 4, 2022
I would like to test a few diodes electrical characteristics at their device low limit, ambient, and device high limit temperatures.
I was thinking of using a Peltier element with a heat sink, but I’m not too sure how this would look like with sending current pulses.
The Peltier element could be put in a thermal chamber, but wouldn’t the length of test leads cause interference with impedance and such?
The diodes of test are listed here:
If you are anticipating an inbound test environment (hundreds to thousands of devices) then I assume you want to test in tape/reel mount with pin probes. I'd suggest:
If you are testing complete reels, then of course you could use a small environmental chamber, fitting your reel to reel testing station inside.
The use of a peltier is possible, though I think it would slow your testing rate.
Answered by Jack Creasey on January 4, 2022
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